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InPA Systems Reveals Active Debug™ and Full Visibility Rapid Prototyping Technology at DesignCon

SAN JOSE, Calif. Jan. 24, 2011 InPA Systems, Inc August 2010 Active Debug™ and Full Visibility Joe Gianelli Bernie Aronson

Active Debug™ and Full Visibility Bernie Aronson

Aronson commented, "These days, I only join advisory boards of companies that really intrigue me – whose technology contributes dramatic change in design efficiency or performance.  InPA’s technology gives the designer full visibility into the debug process and helps them detect the real problems much faster.  It’s the first time a verification engineer can quickly pinpoint problems that emerge in FPGA-based prototypes, and that surely is a major technological milestone.  That’s why I want to talk about how this technology plays in chip design methodologies coming up and what the potential business consequences are.  I’ll be at DesignCon to do just that."

Joe Gianelli #TP – W3 Kevin Morris Wednesday, February 2

A white paper that discusses InPA’s technology will also be on hand at the InPA exhibit booth.  Copies of this white paper will be available to DesignCon attendees and to the general public thereafter.  

About InPA Systems

Active Debug™ and Full Visibility San Jose San Jose, CA

Note:  InPA and Active Debug™ are trademarks of InPA Systems, Inc.    All other trademarks and registered trademarks are the property of their respective owners.  

For more information, contact:

Joe Gianelli

Liz Massingill

InPA Systems

Lee PR

[email protected]

( [email protected] )



SOURCE InPA Systems, Inc.

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