Clifton, NJ (PRWEB) October 20, 2011
Joseph Federico, NJ Micro Electronic Testing Vice President, announces the expansion of its laboratory testing services to include stress testing of a spectrum of materials and structures subjected to a dynamic force or load.
“Our objective is to provide our world recognized testing program and full service technical support to accommodate these various stress analyses to aid in the design of structures such as tunnels, mechanical parts and structural frames,” said Joseph Federico NJ Micro Electronic Testing Vice President. NJ Micro Electronic Testing is headquartered in New Jersey.
The aim of stress testing is to determine whether the element or collection of elements, usually referred to as a structure, can safely withstand the specified forces. This is achieved when the determined stress from the applied force(s) is less than the ultimate tensile strength, ultimate compressive strength or fatigue strength the material is known to be able to withstand. Ordinarily a factor of safety is applied in design. Analysis may be performed through mathematical modeling or simulation, through experimental testing procedures, or a combination of techniques.
For additional information on stress testing or any of NJ Micro’s Testing and Engineering Consultation services, please call Joseph Federico at NJ Micro Electronic Testing Clifton, NJ at (973) 546-5393.
NJ Micro Electronic Testing provides professional electronic component testing to the Commercial, Military, Aerospace, Industrial and Automotive fields worldwide. Its state of the art Mission Imposter® Counterfeit Detection Process identifies counterfeit or cloned products. NJ Micro Electronic Testing also provides standard-based testing of Textiles, Fabrics, Cosmetics and Pharmaceuticals. For more information about the services available, please visit our website at http://njmicroelectronictesting.com.
To learn more about Joseph Federico, visit http://josephfedericocliftonnj.net.
For the original version on PRWeb visit: http://www.prweb.com/releases/prweb2011/10/prweb8892943.htm