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New NI PXI Switch Features Solid-State Architecture to Increase RF Test System Life and Speed for High-Volume Applications

 

AUSTIN, Texas April 24, 2012

News Highlights

  • NI PXI/PXIe-2543
  • The switch increases test throughput and provides long-term measurement repeatability in many high-volume RF production test applications, including semiconductor and mobile device testing.
  • The switch module further extends NI’s broad portfolio of PXI modular instruments to address the latest RF engineering challenges.

 

National Instruments (Nasdaq: NATI) today introduced the new NI PXI/PXIe-2543 solid-state RF multiplexer, which gives test engineers a long-lasting, high-performance solution to optimize the routing of RF signals up to 6.6 GHz. Its solid-state architecture facilitates faster switching and more repeatable measurements than traditional electromechanical switching solutions.


Charles Schroeder

Product Features

  • 6.6 GHz dual 4×1 multiplexer for high-density RF switching, ideal for multisite test
  • Solid-state architecture for superior switch lifetime
  • 50 Ohm termination on all channels for improved RF performance
  • Integrated PXI triggering for fast and repeatable measurements

 

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Learn more about the NI PXI/PXIe-2543 and other NI switches with these additional resources:

 


www.ni.com

National Instruments, NI and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.

Editor Contact:

Sarah Beck, (512) 683-5126

Reader Contact:

Ernest Martinez, (800) 258-7022

 

SOURCE National Instruments

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