SAN JOSE, Calif. July 6, 2011 Zeta Instruments, Inc.
The publication, entitled, ‘Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology’, analyzes how with the assistance of innovative new optical profiler monitoring technology, it is possible to control etchant compounds composition and their duration of exposure on silicon wafers to produce surface textures that optimize light absorption of solar cells. Through the use of these methods, it is possible to significantly improve the efficiency and manufacturing consistency of photo-voltaic cells.
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July 12 – 14, 2011 San Francisco, California
SOURCE Zeta Instruments, Inc.